000 07920naaaa2202365uu 4500
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007 cr|mn|---annan
008 20210212s2020 xx |||||o ||| eng|| d
020 _a9783039282951
020 _a9783039282944
040 _aoapen
_coapen
041 0 _aeng
080 _a004.383
100 1 _aKrólczyk, Grzegorz
_4auth
245 1 0 _aSignal Processing and Analysis of Electrical Circuit
260 _bMDPI - Multidisciplinary Digital Publishing Institute
_c2020
300 _a1 electronic resource (604 p.)
506 0 _aOpen Access
_2star
_fUnrestricted online access
520 _aThis Special Issue with 35 published articles shows the significance of the topic “Signal Processing and Analysis of Electrical Circuit”. This topic has been gaining increasing attention in recent times. The presented articles can be categorized into four different areas: signal processing and analysis methods of electrical circuits; electrical measurement technology; applications of signal processing of electrical equipment; fault diagnosis of electrical circuits. It is a fact that the development of electrical systems, signal processing methods, and circuits has been accelerating. Electronics applications related to electrical circuits and signal processing methods have gained noticeable attention in recent times. The methods of signal processing and electrical circuits are widely used by engineers and scientists all over the world. The constituent papers represent a significant contribution to electronics and present applications that can be used in industry. Further improvements to the presented approaches are required for realizing their full potential.
540 _aCreative Commons
_fhttps://creativecommons.org/licenses/by-nc-nd/4.0/
_2cc
546 _aEnglish
650 0 _94531
_aСигналы и системы
653 _an/a
653 _afault diagnosis
653 _aFPGA
653 _ainduction motor
653 _aSAR ADC
653 _aaccuracy
653 _aspectral analysis
653 _amulti-sensor fusion
653 _atilt sensor
653 _aleast squares solution
653 _amethod of images
653 _awasps
653 _aspatially adapted regularization parameter
653 _anoise reduction
653 _aphase angle
653 _afault injection
653 _adirect sampling
653 _aADMM
653 _atransmitter
653 _ahardware
653 _afrequency characteristic
653 _areconstruction probability
653 _aarray signal processing
653 _abees
653 _amultigroup scan
653 _atuning
653 _amethod
653 _areceiver
653 _aunderwater acoustic signal
653 _achannel-selection-embedded bootstrap
653 _ademodulation
653 _alow noise
653 _atime delay
653 _alow-cost
653 _ainsects
653 _aResistance-to-Period converter
653 _afrequency standard comparator
653 _asystem errors
653 _amicrocontroller
653 _aICEEMD
653 _aphase-locked loop
653 _abroadband
653 _aloop delay circuit
653 _aCMOS technology
653 _ahierarchical heterogeneous multi-DAG workflow
653 _aelectrochemical impedance spectroscopy
653 _acompressed sensing
653 _ainduced current
653 _apole-frequency
653 _ae-traps
653 _arod electrode
653 _aSupport Vector Machines
653 _aratiometric technique
653 _adifferential capacitive sensor
653 _afeature extraction
653 _anight vision
653 _aintention of movement classification
653 _achebyshev polynomial
653 _aRDL
653 _atime-interleaved
653 _abinary search
653 _acurrent buffer
653 _apower management integrated circuit
653 _ainduced charge
653 _adirect digital synthesizer (DDS)
653 _adynamic comparator
653 _achirality
653 _ahigh speed
653 _aSIMON
653 _aduffing chaotic oscillator (DCO)
653 _aDAC
653 _adigital image
653 _aVMD
653 _ashort-circuit fault
653 _acomparator
653 _acommutator motor
653 _afruit flies
653 _apower randomization
653 _aShannon entropy
653 _asecret image sharing
653 _ainterconnect line
653 _aADC
653 _aautomatic calibration
653 _asignal processing
653 _aimage fusion
653 _aEMG-Signals
653 _aLiDAR odometry
653 _a3D-IC design
653 _aphase difference
653 _amatrix eigen-perturbation theory
653 _adelay cell
653 _aanalog-to-digital converter
653 _abrick-wall filter
653 _acurrent mirror
653 _aDC–DC converter
653 _ameasurement noise suppression
653 _aclass AB operation
653 _aCramér–Rao bound
653 _aimpulse noise
653 _achain matrix
653 _afrequency tuning word (FTW)
653 _astability
653 _acolluder attack
653 _arange sensing
653 _aresolver
653 _aIMF
653 _aNILT
653 _aacoustic
653 _asensor data fusion
653 _amultichannel acquisition
653 _asimultaneous localization and mapping (SLAM)
653 _asuccessive approximation register
653 _apassive resistor
653 _aripple voltage measurement
653 _acapacitance-to-time conversion
653 _aswitched capacitor
653 _aheterogeneous earliest finish time
653 _avariational mode decomposition (VMD)
653 _aoffset calibration
653 _acolor palette
653 _alow power
653 _asegmented pre-quantization and bypass
653 _aquasi floating gate
653 _aFresnel lens
653 _aLVDS
653 _apeak-ripple estimation
653 _aelectrostatic induction
653 _acorrelation function
653 _aship-radiated noise
653 _aattenuation
653 _aPM/PWM
653 _aimpedance spectrometry
653 _aTSV noise coupling
653 _aultrasonic phased array
653 _aChebyshev filter
653 _atrue-time-delay
653 _atechnique
653 _apermutation entropy (PE)
653 _aCMOS
653 _astochastic gradient
653 _aimage restoration
653 _adouble rate
653 _aasynchronous
653 _acomplementary filters
653 _aInner and outer product
653 _aoptoelectronics
653 _asingular value decomposition
653 _asignal analysis
653 _arobust read-out circuits
653 _alow-power
653 _aHOCTVL1
653 _aoverlap-add processing
653 _afuzzy logic
653 _adifferential power analysis (DPA)
653 _arandom noise
653 _awingbeat
653 _adiscrete wavelet transform
653 _atensor
653 _aintelligent vehicles
653 _aestimated sparsity
653 _aDoppler shifts
653 _aFRA
653 _adirect position determination
653 _adual Mixing Time difference
653 _aall-pass filter
653 _aAPF
653 _an-out-of-n scheme
653 _ahigh-speed serial interface
653 _aCNFET
700 1 _aAntonino Daviu, Jose Alfonso
_4auth
700 1 _aGlowacz, Adam
_4auth
856 4 0 _awww.oapen.org
_uhttps://mdpi.com/books/pdfview/book/2083
_70
_zDownload
856 4 0 _awww.oapen.org
_uhttps://directory.doabooks.org/handle/20.500.12854/59360
_70
_zDescription
909 _c4
_dDarya Shvetsova
942 _2udc
_cEE
999 _c6374
_d6374